Tuesday, July 14, 2015

First 7nm node test chips developed

A new manufacturing technique has the potential to see a whopping 20 billion transistors packed into a chip the size of a fingernail

IBM Research has successfully created the first 7nm node test chip with functioning transistors, a development that could lead to processors that boast four times the capacity of those on the market today.

.. Continue Reading First 7nm node test chips developed

Section: Electronics

Tags: Related Articles:

No comments:

Post a Comment

Related Posts Plugin for WordPress, Blogger...